IRIS’s patented single-crystal Thallium-doped Cesium Iodide [CsI(Tl)] scintillator provides exceptional spatial resolution and brightness.

Typical commercial X-ray systems have a spatial resolution limited by the source spot size.  The superior resolution of the IRIS scintillator relaxes this limitation resulting in a compact architecture.  This improved configuration increases X-ray source efficiency which, when coupled with the outstanding brightness of our scintillator, provides an incomparable SNR.

Since our scintillator is optically equivalent to a high-quality window, you can use your inverted optical microscope as if you were viewing your sample directly.  With a dual camera port microscope, internal and external sample features can be simultaneously visualized.

 

Higher Resolution, Higher SNR, Enhanced Visualization, Lower Price